by L. Vergara, R. Escobar Galindo, R. Martínez, O. Sánchez, C. Palacio and J. M. Albella
Abstract:
The development of mixed-oxide thin films allows obtaining materials with better properties than those of the different binary oxides, which makes them suitable for a great number of applications in different fields, such as tribology, optics or microelectronics. In this paper we investigate the deposition of mixed chromium and silicon oxides deposited by reactive magnetron sputtering with a view to use them as optical coatings with an adjustable refractive index. These films have been characterized by means of Rutherford backscattering spectrometry, Auger electron spectroscopy, X-ray diffraction, scanning electron microscopy, Fourier-transform infrared spectroscopy and spectroscopic ellipsometry so as to determine how the deposition conditions influence the characteristics of the material. We have found that the deposition parameter whose influence determines the properties of the films to a greater extent is the amount of oxygen in the reactive sputtering gas.
Reference:
L. Vergara, R. Escobar Galindo, R. Martínez, O. Sánchez, C. Palacio and J. M. Albella, “Control of the optical properties of silicon and chromium mixed oxides deposited by reactive magnetron sputtering”, Thin Solid Films, vol. 519, no. 11, pp. 3509–3515.
Bibtex Entry:
@article{vergara_control_2011, title = {Control of the optical properties of silicon and chromium mixed oxides deposited by reactive magnetron sputtering}, volume = {519}, issn = {0040-6090}, url = {http://www.sciencedirect.com/science/article/pii/S0040609011001465}, doi = {10.1016/j.tsf.2011.01.103}, abstract = {The development of mixed-oxide thin films allows obtaining materials with better properties than those of the different binary oxides, which makes them suitable for a great number of applications in different fields, such as tribology, optics or microelectronics. In this paper we investigate the deposition of mixed chromium and silicon oxides deposited by reactive magnetron sputtering with a view to use them as optical coatings with an adjustable refractive index. These films have been characterized by means of Rutherford backscattering spectrometry, Auger electron spectroscopy, X-ray diffraction, scanning electron microscopy, Fourier-transform infrared spectroscopy and spectroscopic ellipsometry so as to determine how the deposition conditions influence the characteristics of the material. We have found that the deposition parameter whose influence determines the properties of the films to a greater extent is the amount of oxygen in the reactive sputtering gas.}, number = {11}, urldate = {2017-10-09}, journal = {Thin Solid Films}, author = {Vergara, L. and Galindo, R. Escobar and Martínez, R. and Sánchez, O. and Palacio, C. and Albella, J. M.}, month = mar, year = {2011}, keywords = {Optical properties, Mixed oxides, Reactive magnetron sputtering}, pages = {3509--3515}, file = {ScienceDirect Full Text PDF:E:\cmam_papers\files\1139\Vergara et al. - 2011 - Control of the optical properties of silicon and c.pdf:application/pdf;ScienceDirect Full Text PDF:E:\Usuarios\Administrator\Zotero\storage\H8X7BSUN\Vergara et al. - 2011 - Control of the optical properties of silicon and c.pdf:application/pdf;ScienceDirect Snapshot:E:\cmam_papers\files\1137\S0040609011001465.html:text/html;ScienceDirect Snapshot:E:\Usuarios\Administrator\Zotero\storage\QU9JWK9Q\S0040609011001465.html:text/html}, }