by Metzger T.H., Carbone D., Biermanns A., Plantevin O., Gago R. and S. and Ziberi B. Facsko
Reference:
Metzger T.H., Carbone D., Biermanns A., Plantevin O., Gago R. and S. and Ziberi B. Facsko, “In-situ and ex-situ x-ray measurements of semiconductor surfaces nano structured by ion beam erosion”, Invited contributions, Nanopatterning via Ions, Photon beam and Epitaxy, Sestri Levante, Italy.
Bibtex Entry:
@misc{th_-situ_2007,
address = {Nanopatterning via Ions, Photon beam and Epitaxy, Sestri Levante, Italy},
type = {Invited contributions},
title = {In-situ and ex-situ x-ray measurements of semiconductor surfaces nano structured by ion beam erosion},
author = {T.H., , Metzger and D., , Carbone and A., , Biermanns and O., , Plantevin and R., , Gago and {Facsko, S.} and {Ziberi, B.} and {Frost, F.}},
month = sep,
year = {2007},
}