by Smith R.W., Plaza J.L., Ghita D., Sánchez M., García B.J., Muñoz-Martín A. and Climent-Font A.
Reference:
Smith R.W., Plaza J.L., Ghita D., Sánchez M., García B.J., Muñoz-Martín A. and Climent-Font A., “The use of HI-ERDA/RBS and NRA/RBS to depth profile N in GaAs1-xNx thin films”, Poster contribution, 18th International Conference on Ion Beam Analysis, Hyderabad, India.
Bibtex Entry:
@misc{rw_use_2007,
address = {18th International Conference on Ion Beam Analysis, Hyderabad, India},
type = {Poster contribution},
title = {The use of {HI}-{ERDA}/{RBS} and {NRA}/{RBS} to depth profile {N} in {GaAs1}-{xNx} thin films},
author = {R.W., , Smith and J.L., , Plaza and D., , Ghita and M., , Sánchez and B.J., , García and A., , Muñoz-Martín and A., , Climent-Font},
month = sep,
year = {2007},
}