New methods for high-resolution ion beam analysis for the composition and structure of nanometer thick (multi-) layers

Jan 15, 2025

by Andrzejewski Roch

Reference:

Andrzejewski Roch, “New methods for high-resolution ion beam analysis for the composition and structure of nanometer thick (multi-) layers”, Seminars at CMAM, CMAM.

Bibtex Entry:

@misc{roch_andrzejewski_new_2007,
	address = {CMAM},
	type = {Seminars at {CMAM}},
	title = {New methods for high-resolution ion beam analysis for the composition and structure of nanometer thick (multi-) layers},
	author = {Roch, Andrzejewski},
	month = dec,
	year = {2007},
}