by Escobar Galindo R.
Reference:
Escobar Galindo R., “Towards nanometric resolution in multilayer depth profiling: RBS, SIMS, XPS and GDOES comparative study”, Invited contributions, III Workshop sobre Nanociencia y Nanotecnología Analíticas., Oviedo, Spain.
Bibtex Entry:
@misc{r_towards_2009,
address = {III Workshop sobre Nanociencia y Nanotecnología Analíticas., Oviedo, Spain},
type = {Invited contributions},
title = {Towards nanometric resolution in multilayer depth profiling: {RBS}, {SIMS}, {XPS} and {GDOES} comparative study},
author = {R., , Escobar Galindo},
year = {2009},
}