by Escobar Galindo R.
Reference:
Escobar Galindo R., “Towards nanometric resolution in multilayer depth profiling: RBS, SIMS, XPS and GDOES comparative study”, Invited contributions, III Workshop sobre Nanociencia y Nanotecnología Analíticas., Oviedo, Spain.
Bibtex Entry:
@misc{r_towards_2009, address = {III Workshop sobre Nanociencia y Nanotecnología Analíticas., Oviedo, Spain}, type = {Invited contributions}, title = {Towards nanometric resolution in multilayer depth profiling: {RBS}, {SIMS}, {XPS} and {GDOES} comparative study}, author = {R., , Escobar Galindo}, year = {2009}, }