by Gago R., R. Escobar Galindo, E. Forniés, Vázquez L., Albella J.M., Muñoz-Martin A. and Climent Font A.
Reference:
Gago R., R. Escobar Galindo, E. Forniés, Vázquez L., Albella J.M., Muñoz-Martin A. and Climent Font A., “Comparison of depth profiling in Cr-Ti-Al multilayer stacks by scattering and optical-emission ion-based techniques”, Poster contribution, 17th International Conference on Ion Beam Analysis (IBA-2005),, Seville, Spain.
Bibtex Entry:
@misc{r_comparison_2005,
address = {17th International Conference on Ion Beam Analysis (IBA-2005),, Seville, Spain},
type = {Poster contribution},
title = {Comparison of depth profiling in {Cr}-{Ti}-{Al} multilayer stacks by scattering and optical-emission ion-based techniques},
author = {R., , Gago and Escobar Galindo, R. and Forniés, E. and L., , Vázquez and J.M., , Albella and A., , Muñoz-Martin and A., , Climent Font},
month = jul,
year = {2005},
}