by Escobar Galindo R.
Reference:
Escobar Galindo R., “Advanced characterisation of nanometer multilayers: depth profiling comparison of RBS, SIMS, XPS and GDOES”, Invited contributions, 7th Iberian Vacuum Meeting and 5th European Topical Conference on Hard Coatings, Caparica, Portugal.
Bibtex Entry:
@misc{r_advanced_2008,
address = {7th Iberian Vacuum Meeting and 5th European Topical Conference on Hard Coatings, Caparica, Portugal},
type = {Invited contributions},
title = {Advanced characterisation of nanometer multilayers: depth profiling comparison of {RBS}, {SIMS}, {XPS} and {GDOES}},
author = {R., , Escobar Galindo},
year = {2008},
}