Use of selected-area diffraction in LEEM | Centro de Micro-Análisis de Materiales

by J.M. and El Gabaly F. Puerta, C. and Saa A. Klein, A.K. and Cerda J.I. Schmid and J. and McCarty K.F. de la Figuera

Reference:

J.M. and El Gabaly F. Puerta, C. and Saa A. Klein, A.K. and Cerda J.I. Schmid and J. and McCarty K.F. de la Figuera, “Use of selected-area diffraction in LEEM”, Himeji, Japan, 2006.

Bibtex Entry:

@misc{puerta_jm_use_2006,
	address = {Himeji, Japan},
	type = {Poster contribution},
	title = {Use of selected-area diffraction in {LEEM}},
	author = {{Puerta, J.M.} and {El Gabaly, F.} and {Klein, C.} and {Saa, A.} and {Schmid, A.K.} and {Cerda, J.I.} and {de la Figuera, J.} and {McCarty, K.F.}},
	month = oct,
	year = {2006},
}