Advanced Characterization of Nanoscale Materials using Atom Probe Tomography

by Clifton Peter H.

Reference:

Clifton Peter H., “Advanced Characterization of Nanoscale Materials using Atom Probe Tomography”, Seminars at CMAM, CAMECA Instruments Inc. Madison, WE 53711 USA.

Bibtex Entry:

@misc{peter_h_clifton_advanced_2016,
	address = {CAMECA Instruments Inc. Madison, WE 53711 USA},
	type = {Seminars at {CMAM}},
	title = {Advanced {Characterization}  of {Nanoscale} {Materials} using {Atom} {Probe} {Tomography}},
	author = {Peter H., Clifton},
	month = sep,
	year = {2016},
}