Ex-situ and in-situ applications of spectroscopic ellipsometry for characterization of wide gap oxide semiconductor thin films

by Vinnichenko Mykola

Reference:

Vinnichenko Mykola, “Ex-situ and in-situ applications of spectroscopic ellipsometry for characterization of wide gap oxide semiconductor thin films”, Seminars at CMAM, Institute of Ion Beam Physics and Materials Research, Forschungszentrum Rossendorf.

Bibtex Entry:

@misc{mykola_vinnichenko_ex-situ_2005,
	address = {Institute of Ion Beam Physics and Materials Research, Forschungszentrum Rossendorf},
	type = {Seminars at {CMAM}},
	title = {Ex-situ and in-situ applications of spectroscopic ellipsometry for characterization of wide gap oxide semiconductor thin films},
	author = {Mykola, Vinnichenko},
	month = dec,
	year = {2005},
}