Materials and strain issues in AlGaN/GaN HEMT degradation | Centro de Micro-Análisis de Materiales

by E. and Rivera C. Muñoz, F. and Redondo-Cubero A. González-Posada, M.F. and Cuerdo R. Romero, F. and Gago R. Calle and A. and Palacio C. Jiménez

Reference:

E. and Rivera C. Muñoz, F. and Redondo-Cubero A. González-Posada, M.F. and Cuerdo R. Romero, F. and Gago R. Calle and A. and Palacio C. Jiménez, “Materials and strain issues in AlGaN/GaN HEMT degradation”, Miyagi, Japan, 2009.

Bibtex Entry:

@misc{munoz_e_materials_2009,
	address = {Miyagi, Japan},
	type = {Invited contributions},
	title = {Materials and strain issues in {AlGaN}/{GaN} {HEMT} degradation},
	shorttitle = {({SSDM} 2009)},
	author = {{Muñoz, E.} and {Rivera, C.} and {González-Posada, F.} and {Redondo-Cubero, A.} and {Romero, M.F.} and {Cuerdo, R.} and {Calle, F.} and {Gago, R.} and {Jiménez, A.} and {Palacio, C.}},
	month = oct,
	year = {2009},
}