In-situ and ex-situ x-ray measurements of semiconductor surfaces nano structured by ion beam erosion

Apr 1, 2022

by T.H. and Carbone D. Metzger, A. and Plantevin O. Biermanns, R. and Facsko S. Gago and B. and Frost F. Ziberi
Reference:
T.H. and Carbone D. Metzger, A. and Plantevin O. Biermanns, R. and Facsko S. Gago and B. and Frost F. Ziberi, “In-situ and ex-situ x-ray measurements of semiconductor surfaces nano structured by ion beam erosion”, Sestri Levante, Italy, 2007.
Bibtex Entry:
@misc{metzger_th_-situ_2007,
	address = {Sestri Levante, Italy},
	type = {Invited contributions},
	title = {In-situ and ex-situ x-ray measurements of semiconductor surfaces nano structured by ion beam erosion},
	author = {{Metzger, T.H.} and {Carbone, D.} and {Biermanns, A.} and {Plantevin, O.} and {Gago, R.} and {Facsko, S.} and {Ziberi, B.} and {Frost,  F.}},
	month = sep,
	year = {2007},
}