Metrology of Defects in Graphitic Materials: Challenges and Implications for Developing New Nano-Devices

by Terrones Mauricio

Reference:

Terrones Mauricio, “Metrology of Defects in Graphitic Materials: Challenges and Implications for Developing New Nano-Devices”, Seminars at CMAM, Research Center for Exotic Nanocarbons, Shinshu University, Nagano (JAPÓN).

Bibtex Entry:

@misc{mauricio_terrones_metrology_2010,
	address = {Research Center for Exotic Nanocarbons, Shinshu University, Nagano (JAPÓN)},
	type = {Seminars at {CMAM}},
	title = {Metrology of {Defects} in {Graphitic} {Materials}: {Challenges} and {Implications} for {Developing} {New} {Nano}-{Devices}},
	author = {Mauricio, Terrones},
	month = oct,
	year = {2010},
}