by Puerta J.M., El Gabaly F., Klein C., A. Saa, Schmid A.K., Cerda J.I., de la Figuera J. and McCarty K.F.
Reference:
Puerta J.M., El Gabaly F., Klein C., A. Saa, Schmid A.K., Cerda J.I., de la Figuera J. and McCarty K.F., “Use of selected-area diffraction in LEEM”, Poster contribution, LEEM-PEEM V Conference, Himeji, Japan.
Bibtex Entry:
@misc{jm_use_2006,
address = {LEEM-PEEM V Conference, Himeji, Japan},
type = {Poster contribution},
title = {Use of selected-area diffraction in {LEEM}},
author = {J.M., , Puerta and F., , El Gabaly and C., , Klein and {Saa, A.} and A.K., , Schmid and J.I., , Cerda and J., , de la Figuera and K.F., , McCarty},
month = oct,
year = {2006},
}