X-ray diffraction and extended x-ray absorption fine-structure characterization of nonspherical crystallographic grains in iron thin films

@article{jimenez-villacorta_x-ray_2004,
	title = {X-ray diffraction and extended x-ray absorption fine-structure characterization of nonspherical crystallographic grains in iron thin films},
	volume = {96},
	issn = {0021-8979},
	url = {http://aip.scitation.org/doi/10.1063/1.1810636},
	doi = {10.1063/1.1810636},
	abstract = {The characterization of iron thin films grown at different substrate temperatures has been performed by x-ray diffraction (XRD) and extended x-ray absorption fine structure (EXAFS). The film growing of iron at low temperatures provides an excellent system to test the results obtained from both techniques because the crystallographic grains present a variation of size and shape as a function of the growing temperature. In both cases, the shape of the particle must be taken into account to calculate their size. The comparison gives a very good agreement when appropriate models are used, showing the reasons for possible differences between the results obtained from a more simple XRD and EXAFS analysis applied to columnar growth systems.},
	number = {11},
	urldate = {2017-07-18},
	journal = {Journal of Applied Physics},
	author = {Jiménez-Villacorta, F. and Muñoz-Martín, A. and Prieto, C.},
	month = nov,
	year = {2004},
	pages = {6224--6229},
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}