LEEM a novel nanocharacterization tool

Jan 24, 2026

by de la Figuera J.
Reference:
de la Figuera J., “LEEM a novel nanocharacterization tool”, Invited contributions, Barcelona, Spain.
Bibtex Entry:
@misc{j_leem_2005,
	address = {Barcelona, Spain},
	type = {Invited contributions},
	title = {{LEEM} a novel nanocharacterization tool},
	author = {J., , de la Figuera},
	month = jun,
	year = {2005},
}