by Joseph T Graham, José Olivares, Vicente Garcia Tavora, Esther Enríquez Pérez, Santanu Kumar Padhi, Miguel Crespillo and Gastón García López
Abstract:
A method for performing low fluence pulsed irradiations with energetic heavy ions is presented. A raster scanner, placed upstream from a sample target chamber, is externally driven by a voltage pulse generated by a function generator. The configuration is similar to an electrostatic chopper, where a voltage difference across the scanner’s electrodes sweeps the beam across the sample, placed slightly off center from the beam axis, resulting in a short irradiation pulse on the sample and a low particle fluence. Such a system was developed at the Centre for Micro Analysis of Materials (CMAM) facility and characterized using 9 MeV F and 18 MeV Cl ions. The system can generate pulses of a few microseconds duration, depending on ion energy and charge state. A diagnostic method for measuring the fluence on the samples by counting etched ion tracks is described. A fluence on the order of 106 cm−2 was obtained by this method. This method could be adopted by other tandem ion accelerator facilities through simple and inexpensive modifications of existing beam handling instruments.
Reference:
Joseph T Graham, José Olivares, Vicente Garcia Tavora, Esther Enríquez Pérez, Santanu Kumar Padhi, Miguel Crespillo and Gastón García López, “Ultra-low fluence irradiation with energetic heavy ion pulsed beam using a modified electrostatic raster scanner”, Physica Scripta, vol. 100, no. 3, pp. 035031.
Bibtex Entry:
@article{graham_ultra-low_2025,
title = {Ultra-low fluence irradiation with energetic heavy ion pulsed beam using a modified electrostatic raster scanner},
volume = {100},
issn = {1402-4896},
url = {https://dx.doi.org/10.1088/1402-4896/adb5d4},
doi = {10.1088/1402-4896/adb5d4},
abstract = {A method for performing low fluence pulsed irradiations with energetic heavy ions is presented. A raster scanner, placed upstream from a sample target chamber, is externally driven by a voltage pulse generated by a function generator. The configuration is similar to an electrostatic chopper, where a voltage difference across the scanner’s electrodes sweeps the beam across the sample, placed slightly off center from the beam axis, resulting in a short irradiation pulse on the sample and a low particle fluence. Such a system was developed at the Centre for Micro Analysis of Materials (CMAM) facility and characterized using 9 MeV F and 18 MeV Cl ions. The system can generate pulses of a few microseconds duration, depending on ion energy and charge state. A diagnostic method for measuring the fluence on the samples by counting etched ion tracks is described. A fluence on the order of 106 cm−2 was obtained by this method. This method could be adopted by other tandem ion accelerator facilities through simple and inexpensive modifications of existing beam handling instruments.},
language = {en},
number = {3},
urldate = {2025-03-11},
journal = {Physica Scripta},
author = {Graham, Joseph T and Olivares, José and Tavora, Vicente Garcia and Pérez, Esther Enríquez and Padhi, Santanu Kumar and Crespillo, Miguel and López, Gastón García},
month = feb,
year = {2025},
pages = {035031},
}