by D. Gallach, L. Le Brizoual, N. Gautier, M.D. Ynsa Alcalá, V. Torres Costa, JP Landesmann and M. Manso Silván
Reference:
D. Gallach, L. Le Brizoual, N. Gautier, M.D. Ynsa Alcalá, V. Torres Costa, JP Landesmann and M. Manso Silván, “Microanalytical detection and microstructural role of C impurities in ZnO porous silicon nanostructured composite films”, Poster contribution, Spring Meeting 2014 European Materials Research Society (EMRS 2014),, Lille, France.
Bibtex Entry:
@misc{gallach_microanalytical_2014,
address = {Spring Meeting 2014 European Materials Research Society (EMRS 2014),, Lille, France},
type = {Poster contribution},
title = {Microanalytical detection and microstructural role of {C} impurities in {ZnO} porous silicon nanostructured composite films},
author = {Gallach, D. and Le Brizoual, L. and Gautier, N. and Ynsa Alcalá, M.D. and Torres Costa, V. and Landesmann, JP and Manso Silván, M.},
year = {2014},
}