by
Reference:
, “Towards nanometric resolution in multilayer depth profiling: RBS, SIMS, XPS and GDOES comparative study”, Oviedo, Spain, 2009.
Bibtex Entry:
@misc{escobar_galindo_r_towards_2009, address = {Oviedo, Spain}, type = {Invited contributions}, title = {Towards nanometric resolution in multilayer depth profiling: {RBS}, {SIMS}, {XPS} and {GDOES} comparative study}, author = {{Escobar Galindo, R.}}, year = {2009}, }