by
Reference:
, “Advanced characterisation of nanometer multilayers: depth profiling comparison of RBS, SIMS, XPS and GDOES”, Caparica, Portugal, 2008.
Bibtex Entry:
@misc{escobar_galindo_r_advanced_2008,
address = {Caparica, Portugal},
type = {Invited contributions},
title = {Advanced characterisation of nanometer multilayers: depth profiling comparison of {RBS}, {SIMS}, {XPS} and {GDOES}},
author = {{Escobar Galindo, R.}},
year = {2008},
}