LEEM a novel nanocharacterization tool

Apr 1, 2022

Reference:

, “LEEM a novel nanocharacterization tool”, Barcelona, Spain, 2005.

Bibtex Entry:

@misc{de_la_figuera_j_leem_2005,
	address = {Barcelona, Spain},
	type = {Invited contributions},
	title = {{LEEM} a novel nanocharacterization tool},
	author = {{de la Figuera, J.}},
	month = jun,
	year = {2005},
}