by J. G. Buijnsters, M. Camero, R. Gago, A. R. Landa-Canovas, C. Gómez-Aleixandre and I. Jiménez
Abstract:
The detection of self-formed C60C60textlessmath display=”inline” overflow=”scroll” altimg=”eq-00002.gif”textgreatertextlessmsubtextgreatertextlessmi mathvariant=”normal”textgreaterCtextless/mitextgreatertextlessmntextgreater60textless/mntextgreatertextless/msubtextgreatertextless/mathtextgreater inclusions in hydrogenated carbon (C:H) with fullerenelike (FL) structure is reported. This material is synthesized by bias-enhanced electron cyclotron resonance chemical vapor deposition at low substrate temperatures (textless120°C)(textless120°C)textlessmath display=”inline” overflow=”scroll” altimg=”eq-00003.gif”textgreatertextlessmrowtextgreatertextlessmotextgreater(textless/motextgreatertextlessmotextgreater<textless/motextgreatertextlessmntextgreater120textless/mntextgreatertextlessmspace width=”0.2em”textgreatertextless/mspacetextgreatertextlessmotextgreater°textless/motextgreatertextlessmi mathvariant=”normal”textgreaterCtextless/mitextgreatertextlessmotextgreater)textless/motextgreatertextless/mrowtextgreatertextless/mathtextgreater. The FL structure is identified by high-resolution transmission electron microscopy whereas the presence of C60C60textlessmath display=”inline” overflow=”scroll” altimg=”eq-00004.gif”textgreatertextlessmsubtextgreatertextlessmi mathvariant=”normal”textgreaterCtextless/mitextgreatertextlessmntextgreater60textless/mntextgreatertextless/msubtextgreatertextless/mathtextgreater inclusions is derived from spectral signatures in the C(1s)C(1s)textlessmath display=”inline” overflow=”scroll” altimg=”eq-00005.gif”textgreatertextlessmrowtextgreatertextlessmi mathvariant=”normal”textgreaterCtextless/mitextgreatertextlessmrowtextgreatertextlessmotextgreater(textless/motextgreatertextlessmntextgreater1textless/mntextgreatertextlessmitextgreaterstextless/mitextgreatertextlessmotextgreater)textless/motextgreatertextless/mrowtextgreatertextless/mrowtextgreatertextless/mathtextgreater x-ray absorption near edge structure. The formation of FL-C:H takes place for negative bias voltages higher than 100V100Vtextlessmath display=”inline” overflow=”scroll” altimg=”eq-00006.gif”textgreatertextlessmrowtextgreatertextlessmntextgreater100textless/mntextgreatertextlessmspace width=”0.3em”textgreatertextless/mspacetextgreatertextlessmi mathvariant=”normal”textgreaterVtextless/mitextgreatertextless/mrowtextgreatertextless/mathtextgreater, in parallel with dehydrogenation and drastic improvement of the tribomechanical film properties.
Reference:
J. G. Buijnsters, M. Camero, R. Gago, A. R. Landa-Canovas, C. Gómez-Aleixandre and I. Jiménez, “Direct spectroscopic evidence of self-formed C60 inclusions in fullerenelike hydrogenated carbon films”, Applied Physics Letters, vol. 92, no. 14, pp. 141920.
Bibtex Entry:
@article{buijnsters_direct_2008,
	title = {Direct spectroscopic evidence of self-formed {C60} inclusions in fullerenelike hydrogenated carbon films},
	volume = {92},
	issn = {0003-6951},
	url = {http://aip.scitation.org/doi/10.1063/1.2903502},
	doi = {10.1063/1.2903502},
	abstract = {The detection of self-formed C60C60{textless}math display="inline" overflow="scroll" altimg="eq-00002.gif"{textgreater}{textless}msub{textgreater}{textless}mi mathvariant="normal"{textgreater}C{textless}/mi{textgreater}{textless}mn{textgreater}60{textless}/mn{textgreater}{textless}/msub{textgreater}{textless}/math{textgreater} inclusions in hydrogenated carbon (C:H) with fullerenelike (FL) structure is reported. This material is synthesized by bias-enhanced electron cyclotron resonance chemical vapor deposition at low substrate temperatures ({textless}120°C)({textless}120°C){textless}math display="inline" overflow="scroll" altimg="eq-00003.gif"{textgreater}{textless}mrow{textgreater}{textless}mo{textgreater}({textless}/mo{textgreater}{textless}mo{textgreater}&lt;{textless}/mo{textgreater}{textless}mn{textgreater}120{textless}/mn{textgreater}{textless}mspace width="0.2em"{textgreater}{textless}/mspace{textgreater}{textless}mo{textgreater}°{textless}/mo{textgreater}{textless}mi mathvariant="normal"{textgreater}C{textless}/mi{textgreater}{textless}mo{textgreater}){textless}/mo{textgreater}{textless}/mrow{textgreater}{textless}/math{textgreater}. The FL structure is identified by high-resolution transmission electron microscopy whereas the presence of C60C60{textless}math display="inline" overflow="scroll" altimg="eq-00004.gif"{textgreater}{textless}msub{textgreater}{textless}mi mathvariant="normal"{textgreater}C{textless}/mi{textgreater}{textless}mn{textgreater}60{textless}/mn{textgreater}{textless}/msub{textgreater}{textless}/math{textgreater} inclusions is derived from spectral signatures in the C(1s)C(1s){textless}math display="inline" overflow="scroll" altimg="eq-00005.gif"{textgreater}{textless}mrow{textgreater}{textless}mi mathvariant="normal"{textgreater}C{textless}/mi{textgreater}{textless}mrow{textgreater}{textless}mo{textgreater}({textless}/mo{textgreater}{textless}mn{textgreater}1{textless}/mn{textgreater}{textless}mi{textgreater}s{textless}/mi{textgreater}{textless}mo{textgreater}){textless}/mo{textgreater}{textless}/mrow{textgreater}{textless}/mrow{textgreater}{textless}/math{textgreater} x-ray absorption near edge structure. The formation of FL-C:H takes place for negative bias voltages higher than 100V100V{textless}math display="inline" overflow="scroll" altimg="eq-00006.gif"{textgreater}{textless}mrow{textgreater}{textless}mn{textgreater}100{textless}/mn{textgreater}{textless}mspace width="0.3em"{textgreater}{textless}/mspace{textgreater}{textless}mi mathvariant="normal"{textgreater}V{textless}/mi{textgreater}{textless}/mrow{textgreater}{textless}/math{textgreater}, in parallel with dehydrogenation and drastic improvement of the tribomechanical film properties.},
	number = {14},
	urldate = {2017-09-18},
	journal = {Applied Physics Letters},
	author = {Buijnsters, J. G. and Camero, M. and Gago, R. and Landa-Canovas, A. R. and Gómez-Aleixandre, C. and Jiménez, I.},
	month = apr,
	year = {2008},
	pages = {141920},
	file = {Full Text PDF:E:\cmam_papers\files\847\Buijnsters et al. - 2008 - Direct spectroscopic evidence of self-formed C60 i.pdf:application/pdf;Full Text PDF:E:\Usuarios\Administrator\Zotero\storage\BNUR5YIN\Buijnsters et al. - 2008 - Direct spectroscopic evidence of self-formed C60 i.pdf:application/pdf;Snapshot:E:\cmam_papers\files\848\1.html:text/html;Snapshot:E:\Usuarios\Administrator\Zotero\storage\YTYGMAZZ\1.html:text/html},
}