Microstructural characterization of medium-keV Ar ion-induced surface riples in Si by atomic force and electron microscopy

by Chini Tapas Kumar

Reference:

Chini Tapas Kumar, “Microstructural characterization of medium-keV Ar ion-induced surface riples in Si by atomic force and electron microscopy”, Seminars at CMAM, Surface Physics Division, Saha Institute of Nuclear Physics, Kolkata (India).

Bibtex Entry:

@misc{tapas_kumar_chini_microstructural_2005,
	address = {Surface Physics Division, Saha Institute of Nuclear Physics, Kolkata (India)},
	type = {Seminars at {CMAM}},
	title = {Microstructural characterization of medium-{keV} {Ar} ion-induced surface riples in {Si} by atomic force and electron microscopy},
	author = {Tapas Kumar, Chini},
	month = nov,
	year = {2005},
}