by Rafael Saavedra, Piedad Martin, David Jimenez-Rey and Rafael Vila
Abstract:
The structural changes produced by ion irradiation, He+ (2.5MeV), O4+ (13.5MeV), Si4+ (24.4MeV), and Cu7+ (32.6MeV), in different types of silica (KU1, KS-4V and Infrasil 301) were observed by IR reflection spectroscopy. The IR reflectance spectra were measured between 400 and 1400cm−1. Structural bands wavenumber of the three silica grades, irradiated with the same ion and fluence, is independent on OH or impurity content of silica. Modification in the surface structure of the irradiated face of a silica sample was studied monitoring the changes in the wavenumber of fundamental structural bands as function of the ion fluence. Samples irradiated at high ion fluence present a shift of known structural bands and new IR reflection bands around 608cm−1 and between 920 and 990cm−1, corresponding to a new structure. The spectra of neutron irradiated samples at fluences 1017 and 1018n/cm2 were also measured and compared with ion irradiated samples.
Reference:
Rafael Saavedra, Piedad Martin, David Jimenez-Rey and Rafael Vila, “Structural changes induced in silica by ion irradiation observed by IR reflectance spectroscopy”, Fusion Engineering and Design, vol. 98-99, no. Supplement C, pp. 2034–2037.
Bibtex Entry:
@article{saavedra_structural_2015,
series = {Proceedings of the 28th {Symposium} {On} {Fusion} {Technology} ({SOFT}-28)},
title = {Structural changes induced in silica by ion irradiation observed by {IR} reflectance spectroscopy},
volume = {98-99},
issn = {0920-3796},
url = {http://www.sciencedirect.com/science/article/pii/S0920379615002896},
doi = {10.1016/j.fusengdes.2015.04.060},
abstract = {The structural changes produced by ion irradiation, He+ (2.5MeV), O4+ (13.5MeV), Si4+ (24.4MeV), and Cu7+ (32.6MeV), in different types of silica (KU1, KS-4V and Infrasil 301) were observed by IR reflection spectroscopy. The IR reflectance spectra were measured between 400 and 1400cm−1. Structural bands wavenumber of the three silica grades, irradiated with the same ion and fluence, is independent on OH or impurity content of silica. Modification in the surface structure of the irradiated face of a silica sample was studied monitoring the changes in the wavenumber of fundamental structural bands as function of the ion fluence. Samples irradiated at high ion fluence present a shift of known structural bands and new IR reflection bands around 608cm−1 and between 920 and 990cm−1, corresponding to a new structure. The spectra of neutron irradiated samples at fluences 1017 and 1018n/cm2 were also measured and compared with ion irradiated samples.},
number = {Supplement C},
urldate = {2017-10-24},
journal = {Fusion Engineering and Design},
author = {Saavedra, Rafael and Martin, Piedad and Jimenez-Rey, David and Vila, Rafael},
month = oct,
year = {2015},
keywords = {Ion irradiation, Silica glass, IR reflection, Surface cracks},
pages = {2034--2037},
file = {ScienceDirect Full Text PDF:E:\cmam_papers\files\1398\Saavedra et al. - 2015 - Structural changes induced in silica by ion irradi.pdf:application/pdf;ScienceDirect Full Text PDF:E:\Usuarios\Administrator\Zotero\storage\H7W7PZVU\Saavedra et al. - 2015 - Structural changes induced in silica by ion irradi.pdf:application/pdf;ScienceDirect Snapshot:E:\cmam_papers\files\1391\S0920379615002896.html:text/html;ScienceDirect Snapshot:E:\Usuarios\Administrator\Zotero\storage\WF2GF4VD\S0920379615002896.html:text/html},
}