by E. Román, Y. Huttel, M. F. López, R. Gago, A. Climent-Font, A. Muñoz-Martín and A. Cebollada
Abstract:
The structure of epitaxial 40Å thick V(001) films grown at room and high temperature (723K) in MgO/V/MgO(001) model heterostructures is studied in detail by means of X-ray photoemission spectroscopy, Rutherford backscattering spectrometry and elastic recoil detection analysis. The resulting structures of samples grown at both temperatures is very similar, including the eventual contamination by hydrogen in the V layer, and only subtle modifications at the V/MgO(001) interface have been observed. These differences at the very first V layers grown on MgO(001) surface could infer in the growth of the subsequent V layers. The influence of the nature of the V oxides at the V/MgO(001) interface on the properties of the 40Å thick V(001) films is discussed.
Reference:
E. Román, Y. Huttel, M. F. López, R. Gago, A. Climent-Font, A. Muñoz-Martín and A. Cebollada, “Structure of MgO/V/MgO(001) thin films studied by the combination of X-ray photoemission and ion beam analysis techniques”, Surface Science, vol. 600, no. 2, pp. 497–506.
Bibtex Entry:
@article{roman_structure_2006, title = {Structure of {MgO}/{V}/{MgO}(001) thin films studied by the combination of {X}-ray photoemission and ion beam analysis techniques}, volume = {600}, issn = {0039-6028}, url = {http://www.sciencedirect.com/science/article/pii/S0039602805012458}, doi = {10.1016/j.susc.2005.11.001}, abstract = {The structure of epitaxial 40Å thick V(001) films grown at room and high temperature (723K) in MgO/V/MgO(001) model heterostructures is studied in detail by means of X-ray photoemission spectroscopy, Rutherford backscattering spectrometry and elastic recoil detection analysis. The resulting structures of samples grown at both temperatures is very similar, including the eventual contamination by hydrogen in the V layer, and only subtle modifications at the V/MgO(001) interface have been observed. These differences at the very first V layers grown on MgO(001) surface could infer in the growth of the subsequent V layers. The influence of the nature of the V oxides at the V/MgO(001) interface on the properties of the 40Å thick V(001) films is discussed.}, number = {2}, urldate = {2017-07-21}, journal = {Surface Science}, author = {Román, E. and Huttel, Y. and López, M. F. and Gago, R. and Climent-Font, A. and Muñoz-Martín, A. and Cebollada, A.}, month = jan, year = {2006}, keywords = {RBS, ERDA, Multilayers, Vanadium, X-ray photoelectron spectroscopy}, pages = {497--506}, file = {ScienceDirect Snapshot:E:\cmam_papers\files\572\S0039602805012458.html:text/html;ScienceDirect Snapshot:E:\Usuarios\Administrator\Zotero\storage\WGBZX9WS\S0039602805012458.html:text/html}, }