Materials and strain issues in AlGaN/GaN HEMT degradation | Centro de Micro-Análisis de Materiales

by Muñoz E., Rivera C., González-Posada F., Redondo-Cubero A., Romero M.F., R. and Calle F. Cuerdo and R. and Jiménez A. Gago

Reference:

Muñoz E., Rivera C., González-Posada F., Redondo-Cubero A., Romero M.F., R. and Calle F. Cuerdo and R. and Jiménez A. Gago, “Materials and strain issues in AlGaN/GaN HEMT degradation”, Invited contributions, Miyagi, Japan.

Bibtex Entry:

@misc{e_materials_2009,
	address = {Miyagi, Japan},
	type = {Invited contributions},
	title = {Materials and strain issues in {AlGaN}/{GaN} {HEMT} degradation},
	shorttitle = {({SSDM} 2009)},
	author = {E., , Muñoz and C., , Rivera and F., , González-Posada and A., , Redondo-Cubero and M.F., , Romero and {Cuerdo, R.} and {Calle, F.} and {Gago, R.} and {Jiménez, A.} and {Palacio, C.}},
	month = oct,
	year = {2009},
}