by S Bär, G Huber, J Gonzalo, A Perea, A Climent and F Paszti
Abstract:
This paper focuses on the preparation and characterization of crystalline thin films of rare-earth-doped sesquioxides (Y2O3, Lu2O3,and Sc2O3) grown by pulsed laser deposition (PLD) on single-crystal (0001) sapphire substrates. X-ray diffraction (XRD) measurements show that the films with thicknesses between 1 and 500nm were highly textured along the [111] direction. Using Rutherford backscattering (RBS) analysis the correct stoichiometric composition of the films could be proved. The emission and excitation spectra of the europium-doped films down to a thickness of 100nm look similar to those of the corresponding crystalline bulk material, whereas films with 20nm thickness and below show a completely different emission behavior.
Reference:
S Bär, G Huber, J Gonzalo, A Perea, A Climent and F Paszti, “Europium-doped sesquioxide thin films grown on sapphire by PLD”, Materials Science and Engineering: B, vol. 105, no. 1, pp. 30–33.
Bibtex Entry:
@article{bar_europium-doped_2003,
series = {{EMRS} 2003 {Symposium} {J}, {Rare} {Earth} {Doped} {Materials} for {Photonics}},
title = {Europium-doped sesquioxide thin films grown on sapphire by {PLD}},
volume = {105},
issn = {0921-5107},
url = {http://www.sciencedirect.com/science/article/pii/S0921510703003635},
doi = {10.1016/j.mseb.2003.08.010},
abstract = {This paper focuses on the preparation and characterization of crystalline thin films of rare-earth-doped sesquioxides (Y2O3, Lu2O3,and Sc2O3) grown by pulsed laser deposition (PLD) on single-crystal (0001) sapphire substrates. X-ray diffraction (XRD) measurements show that the films with thicknesses between 1 and 500nm were highly textured along the [111] direction. Using Rutherford backscattering (RBS) analysis the correct stoichiometric composition of the films could be proved. The emission and excitation spectra of the europium-doped films down to a thickness of 100nm look similar to those of the corresponding crystalline bulk material, whereas films with 20nm thickness and below show a completely different emission behavior.},
number = {1},
urldate = {2017-07-18},
journal = {Materials Science and Engineering: B},
author = {Bär, S and Huber, G and Gonzalo, J and Perea, A and Climent, A and Paszti, F},
month = dec,
year = {2003},
keywords = {Europium, Pulsed laser deposition, RBS, XRD, YO thin films},
pages = {30--33},
file = {ScienceDirect Snapshot:E:\cmam_papers\files\384\S0921510703003635.html:text/html;ScienceDirect Snapshot:E:\Usuarios\Administrator\Zotero\storage\2IW2Z7EA\S0921510703003635.html:text/html},
}