Event 

Title:
Seminarios en el Acelerador - Desviaciones en las dispersiones elasticas de Rutherford para las secciones eficaces para Cu y Zn con iones de He
When:
06.06.2013 - 06.06.2013
Where:
CMAM - Madrid
Categoría:
Seminarios informales en el Acelerador

Description

Ponente: Aurelio Climent Font, CEntro de Micro-Análisis de Materiales (CMAM), Madrid, España

Titulo: Desviaciones en las dispersiones elasticas de Rutherford para las secciones eficaces para Cu y Zn con iones de He

Abstract: Kesterites, Cu2ZnSn(S,Se)4, are an attractive materials for thin film solar cells. In spite of its lower achieved efficiency  11.1 % [1], as compared to other materials used for this purpose like Cu(In,Ga)Se2 (20.3 % efficiency) [2], kesterites have the advantage of being composed by abundant elements against the scarcity of In and Ga. A challenge for solar cell kesterites is the growth of single phase material because of the negative role of predicted secondary phases [3,4].  Elastic backscattering spectrometry is a powerful analytical technique to determine depth composition profiles and as such is an interesting tool for the determination of the elemental composition of thin films intended to be kesterites . In RBS  the mass resolution decreases as the difference in mass of projectile and target atom increases, and in the case of kesterites the composing  elements Cu and Zn are neighbors in the periodic table, Z values of 29 and 30 respectively, being the average atomic masses different by less than 2 amu. One way to improve the mass resolution is to increase the projectile energy.  In this work, we report on the deviations observed in Cu and Zn Rutherford cross section while performing He elastic backscattering measurements in the energy range from 4 to 10 MeV. The results obtained concerning   the onset energy for the deviation of Rutherford formula agree well with the calculations of Bozoian et al. [5].

[1] T.K. Todorov et al, Adv. Energy Matter (2012), doi: 10.1002/aenm.201200348.
[2] P. Jackson, D. Hariskos, E. Lotter, S. Paetel, R. Wuerz, R. Menner, W. Wischmann, and M. Powalla.  Prog. Photovolt: Res Appl. 19 (2011) 894.
[3] I.V. Dudchak, and L.V. Piskach. J. Alloys and Compounds 351 (2003) 145.
[4] I.D. Olekseyuk, I.V. Dudchak, and L.V. Piskach, J. Alloys and Compounds 368 (2004) 135.
[5] M. Bozoian, K.M. Hubbard, and M. Nastasi. Nucl. Instr. Meth. B51, (1990) 311.

A. Climent-Font1,2, R. Caballero2, E. Punzón-Quijorna1,2, J.M. Merino2, M. León2.
1Centro de Micro-Análisis de Materiales (CMAM), Universidad Autónoma de Madrid, Campus de Cantoblanco, E-28049, Madrid, Spain.
2Departamento de Física Aplicada, Universidad Autónoma de Madrid, Campus de Cantoblanco, E-28049, Madrid, Spain.

 

Venue

CMAM
Venue:
CMAM   -   Website
Street:
Faraday 3, Campus de Cantoblanco
ZIP:
28049
City:
Madrid
Country:
Country: es

Description

El seminario tendrá lugar en la sala de reuniones del CMAM