Seminar at the Accelerator - Metrology of Defects in Graphitic Materials: Challenges and Implication
21.10.2010 - 21.10.2010
CMAM - Madrid
Informal seminars at the Accelerator


Different types of defects within graphene and carbon nanotubes: 1) Structural defects; 2) Bond rotations or grain boundaries; 3) Doping-induced defects; 4) Non-sp2 carbon defects or edge-sites, and 5) Folded (or highly strained) graphene. We will review different techniques used to identify defects: SEM, HRTEM, STM, STS, AFM, Raman spectroscopy (RS), photoluminescence spectroscopy (PLS), thermogravimetric analyses (TGA), electron and thermal transport measurements, etc. The presence of defects and their identification has been overlooked by numerous scientists. However these play a key role in the nanotubes’ physico-chemical properties and even biocompatibility. We will answer the following questions: How do we identify defects efficiently? Could we distinguish among various defects? Would it be possible to establish a protocol able to quantify and control the amount of these defects? How many defects are necessary to fabricate robust polymer composites or 3D architectures? Could I introduce specific defects in order to make materials biocompatible? Could we promote ferromagnetism by introducing specific defects in nanostructures? Could I control their specific reactivity in order to use them as sensors, filters or drug deliverers? etc.

Mauricio Terrones (mtterrones@shinshu-u.ac.jp; mtterrones@gmail.com), Research Center for Exotic Nanocarbons Shinshu University, 4-17-1 Wakasato, Nagano City 380-8553, Japan.

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The seminar takes place at the meeting room of the CMAM