Event 

Title:
Seminars at the Accelarator - Advanced characterization of nanoescale materials using atom ...
When:
28.09.2016 - 28.09.2016
Where:
CMAM - Madrid
Category:
Informal seminars at the Accelerator

Description

Speaker: Peter H. Clifton, CAMECA Instruments, Inc.

Title: Advanced characterization of nanoescale materials using atom probe tomography

Abstract: In the 15 years or so since the introduction of the first commercially-available Atom Probe Tomography (APT) instruments the improvements in the capability of the technique have been quite remarkable[1]. Whilst still maintaining the unique capability to detect, identify and position individual atoms with near atomic resolutions in three dimensions, analysis volumes have increased dramatically, improved detector performance and mass resolving power has produced real enhancements in detection sensitivities, compositional accuracy and precision, and the introduction of laser mode has enabled analysis of very many material systems beyond traditional bulk metals. In addition, the maturation of FIB-based specimen preparation methods has made site-specific analyses truly routine.

This presentation will provide an overview of the APT technique and recent developments but the bulk of the time will be spent reviewing the diverse range of material science applications which can be addressed by APT. These examples will include bulk and hybrid metals systems and well as a variety of functional materials, complex structures and devices.

REFERENCES
[1] D.J. Larson, et al., “Local Electrode Atom Probe Tomography: A User’s Guide”, (Springer 2013).

 

Venue

CMAM
Venue:
CMAM   -   Website
Street:
Faraday 3, Campus de Cantoblanco
ZIP:
28049
City:
Madrid
Country:
Country: es

Description

The seminar takes place at the meeting room of the CMAM